Reference materials

Unalloyed Copper - Cu VII, tyčka

SRM500

Product Detail

Semiconductor Thin Film: AlxGa1-xAs Epitaxial Layers (Al mole fraction x near 0.30), disk

SRM2842

Product Detail

Relative Intensity Correction Standard for Fluorescence Spectroscopy: Red Emission

SRM2944

Product Detail

Potassium (K) Standard Solution, 5x 10 ml

SRM3141a

Product Detail

Tungsten (W) Standard Solution, 50 ml

SRM3163

Product Detail

Ytterbium (Yb) Standard Solution, 5x 10 ml

SRM3166a

Product Detail

Sulfur Dioxide in Nitrogen (Nominal Amount-of-Substance Fraction 3500 µmol/mol)

SRM1696a

Product Detail

Soda-Lime Sheet Glass (Nominal Mass Fraction 1.2 % Al2O3), 3 destičky

SRM1831

Elements: O, Cl, PAU, N total, AOX, KOH, OCP, CH3Hg, TPH, Br, H, Ag, Al, As, Au, B, Ba, Be, Bi, Ca, Cd, Ce, Co, Cr, Cs, Cu, Dy, Er, Eu, Fe, Ga, Gd, Ge, Hf, Hg, Ho, In, Ir, K, La, Li, Lu, Mg, Mn, Mo, Na, Nb, Nd, Ni, Os, P, Pb, Pd, Pr, Pt, Rb, Re, Rh, Ru, S, Sb, Sc, Se, Si, Sm, Sn, Sr, Ta, Tb, Te, Th, Ti, Tl, Tm, U, V, W, Y, Yb, Zn, Zr, Br-, Cl-, F-, I-, NO2-, NO3-, PO43-, SO42-, Cr6+, NH4+, 6Li, N-NO3-, N-NH4+, P-PO43-, S-SO42-, N-NO2-, C org., C anorg.

Product Detail

Vickers Microhardness of Nickel

SRM1908

Elements: N total, AOX, KOH, OCP, CH3Hg, TPH, Br, H, O, Cl, PAU, Ag, Al, As, Au, B, Ba, Be, Bi, Ca, Cd, Ce, Co, Cr, Cs, Cu, Dy, Er, Eu, Fe, Ga, Gd, Ge, Hf, Hg, Ho, In, Ir, K, La, Li, Lu, Mg, Mn, Mo, Na, Nb, Nd, Ni, Os, P, Pb, Pd, Pr, Pt, Rb, Re, Rh, Ru, S, Sb, Sc, Se, Si, Sm, Sn, Sr, Ta, Tb, Te, Th, Ti, Tl, Tm, U, V, W, Y, Yb, Zn, Zr, Br-, Cl-, F-, I-, NO2-, NO3-, PO43-, SO42-, Cr6+, NH4+, 6Li, N-NO3-, N-NH4+, P-PO43-, S-SO42-, N-NO2-, C org., C anorg.

Product Detail

Single Crystal Diffractometer Alignment Standard - Ruby Sphere, 3 kuličky

SRM1990

Product Detail

Zeta Potential - Colloidal Silica (Nominal Mass Fraction 2.2 %), 2 x 25 ml

SRM1993

Product Detail

Bingham Mortar Mixture for Rheological Measurements, souprava pro dvě dávky

SRM2493

Product Detail